Optical Metrology
Optical metrology is the use of optical components to measure physical properties of materials, objects and processes. In particular, it involves quantifying light waves in order to understand the physical characteristics of materials under study. Optical metrology is one of the most precise forms of measurement and requires precise equipment.
There are many types of optical metrology, including microscopy, positron emission tomography (PET), fluorescence spectroscopy and interferometry. Each of these techniques measure light waves at different frequencies, allowing researchers to determine the composition or physical properties of a material. For example, microscopy is used to magnify an object, while fluorescence spectroscopy can measure the absorption of light at different wavelengths.
In the field of optical metrology, there are several techniques used to quantify light waves. Some techniques are used to determine the size, intensity, wavelength and phase of light. Other techniques are used to measure the angle at which light is emitted. This can include measuring polarization, the angle of refraction, and the shape and position of reflectors.
One of the most common techniques used in optical metrology is called optical profilometry. This involves using a computed tomography (CT) scan technique to measure the physical surface profile of an object. Optical profilometry can be used to measure subtle features, down to a few micrometers in size. This type of metrology is useful for monitoring the quality and tolerances in automotive and aircraft components.
Optical interferometry is another type of optical metrology and is used to measure the interference of two or more optical waves in order to determine the shape and structure of an object. This type of metrology requires a highly precise light source and sophisticated optical components. It is commonly used in optical engineering such as laser welding, where it is used to measure the weld surface quality and to ensure the desired surface finish.
Another type of optical metrology is called scatterometry and it is used to measure the intensity of scattered light from a sample surface. Scatterometry is used to measure the physical parameters of a surface, such as the texture, roughness, waviness and slope. This type of metrology is useful for optical-electrical processes, such as the characterization of photolithographic processes used in the fabrication of semiconductors.
Optical metrology is an invaluable tool for engineers, researchers, and manufacturing professionals. It allows for precise measurements of materials, objects and processes in order to ensure high quality and performance. There are many types of optical metrology, including microscopy, PET, fluorescence spectroscopy, optical profilometry, optical interferometry, and scatterometry. Each of these techniques can provide accurate and detailed measurements, helping to ensure the highest level of accuracy and quality.