Transmission Electron Microscopy (TEM) is a type of microscope used to investigate the structure of small, invisible objects such as molecules, atoms, and cells. It works by passing a beam of electrons through an extremely thin specimen and measuring the subtle changes in the intensity and direction of the beam due to the interaction of the electrons with the specimen. This technique is highly useful in observing very small objects in high detail, as the electrons are thousands of times smaller than the wavelength of visible light, giving the TEM up to a thousand times more resolution power than a light microscope.
TEMs can also be used to image the interior structure of materials, and often in combination with a method known as energy-dispersive X-ray spectroscopy (EDS). This technique measures the amount of X-ray radiation closely associated with the direction and speed of electron beams within a sample, allowing the user to identify or quantify the elements within a sample they are examining. This technique can be especially useful in studying metals, as metals tend to be heavily composed of elements such as iron, nickel, copper, and chromium.
Another important technique used in conjunction with TEMs is Electron Energy Loss Spectroscopy (EELS). This technique uses a detector placed behind the sample to measure the energy and momentum of the electrons which pass through the sample. When combined with the technique of Electron Repeat Unit (ERU), this allows the user to estimate the binding energy of the various atomic structures within the sample. This information provides valuable insight into the chemical composition of the sample and the level of molecular cohesion of the material.
The most powerful application of TEM lies in its use for observing extremely small objects at very high magnification. This is achieved by using an extremely bright electron beam and a special type of electron-sensitive film. The film is placed directly behind the specimen and captures the image of the specimen illuminated by the electron beam. This image can then be viewed or studied in great detail, allowing the scientist to gain insight into the structure of the object at a previously unattainable level of detail.
TEM is widely used in the advancement of science and technology. Semiconductors, nanotubes and materials such as graphene, carbon nanotubes, and other nanostructures, can all be studied using TEM. The technique has also been used in medical research and nursing studies to measure cell structure and tissue properties. TEM has also been used to create stunning pictures of the inner workings of individual viruses in the 1970s. Today, TEM is a popular choice for investigating the 3-D functionality of biological materials at the nanoscale.
TEM has also become an interesting research tool outside of science and medicine in fields such as art conservation and history. It can now be used to study the structure and internal makeup of ancient artifacts, including coins, fossils, and artifacts to bring some seemingly lost pieces of history to life.
Overall, TEM has revolutionized the study of small objects and large structures and continues to contribute to the advancement of science and technology. The variety of techniques used in conjunction with TEM allows a scientist to explore the unknown and uncover information previously impossible to attain. Through its abilities to look inside complex materials, TEM has opened up a new way of investigation, giving us valuable insight into the world around us.